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Brian P. Wilfley, Ph.D
Dr. Wilfley has over 20 years of experience in leading development efforts for medical device and optical instrumentation concerns. His expertise includes a demonstrated ability to measure, analyze and exploit the performance of complex systems; and develop algorithms for data analysis, system control, and image processing. He has developed image processing pipeline tools to process tens of thousands of x-ray images, a scripting tool-set to drive image reconstruction, and a simulated-annealing technique for optimizing pixel positions in x-ray detectors. He has constructed models and code to implement the Automatic Exposure Control system for a scanning beam digital x-ray system and a rule-based method of assigning imaging parameters to clinical situations. He designed a standard experimental and analysis methodology for testing x-ray targets, and tools to drive simulation of microwave cavities used to measure protein-ligand binding. He has also developed techniques for measuring numerous system performance parameters including spatial resolution, noise-power, quantum-efficiency, electron-beam spot shape and alignment, x-ray beam quality, x-ray leakage, and magnetic shielding. Dr. Wilfley is a co-inventor of six issued patents and has authored a number of technical papers. He received his AB in Physics from the University of California at Berkeley and his Ph.D. in Physics from the University of California at San Diego.
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