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Peter Bajorski, Ph.D., is Associate Professor in the Center for Quality and Applied Statistics at the Rochester Institute of Technology. Prof. Bajorski holds a Ph.D. degree in mathematical statistics, a BS/MS in mathematics, and an M.Eng. in industrial engineering. Prior to joining RIT, he held positions at Cornell University, and was an Associate Statistician at the Engineering Research and Development Bureau, New York State Department of Transportation. Dr. Bajorski's statistical expertise is in regression techniques, multivariate analysis, design of experiments, and nonparametric methods. He is certified as a Six Sigma Black Belt and is familiar with the Lean Enterprise approach to process improvement. Dr. Bajorski has published 35 research papers in scientific journals and is President of the Rochester Chapter of the American Statistical Association. | 